可靠芯片系统设计与测试技术
[Raimund Ubar, Jaan Raik]
TN
9781609602123 USD180.0
Information Science Reference
2010-12-31
Hardback
Built/in self repair for logic structures/ combined test/data compression and test planning/ diagnostic modeling of digital systems/ fault simulation and fault injection technology/ fault/tolerant and fail/safe design based on reconfiguration/ flexible fault/tolerant schedules for embedded systems/ memory testing and self/repair/ optimizing fault tolerance for multi/processor system/on/chip/ software/based self/test of embedded microprocessors/ transient faults detection and compensation/
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