Design And Test Technology For Dependable Systems-on-chip

可靠芯片系统设计与测试技术

[Raimund Ubar, Jaan Raik]

TN

9781609602123  USD180.0

Information Science Reference   2010-12-31   Hardback

Built/in self repair for logic structures/ combined test/data compression and test planning/ diagnostic modeling of digital systems/ fault simulation and fault injection technology/ fault/tolerant and fail/safe design based on reconfiguration/ flexible fault/tolerant schedules for embedded systems/ memory testing and self/repair/ optimizing fault tolerance for multi/processor system/on/chip/ software/based self/test of embedded microprocessors/ transient faults detection and compensation/